Prospects for the LIBS Study of Films
Using an Axicon Optical System

E. L. Surmenko, T. N. Sokolova, Yu. V. Chebotarevsky, and I. A. Popov

Saratov State Technical University, Politekhnicheskaya ul. 77, Saratov, 410054 Russia

e-mail: surmenko@yandex.ru

Received November 17, 2008

Abstract—The features of the application of an axicon optical system for the LIBS sampling are described.
For the axicon sampling, the crater depth is less than that for a conventional spherical lens. The zone of thermal
effect around a sampling point is also reduced. The results obtained indicate that the axicon optical system is
promising for the thin-film study.

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