Optoelectronics, Instrumentation and Data Processing

Publisher: Allerton Press, Inc.

ISSN PRINT: 8756-6990
ISSN ONLINE: 1934-7944

ABOUT THIS JOURNAL

Journal Metrics

Usage
  • 4256Downloads 2018
    Springer measures the usage on the SpringerLink platform according to the COUNTER (Counting Online Usage of NeTworked Electronic Resources) standards.
  • 18 Usage Factor 2017/2018
    The Springer Journal Usage Factor 2017/18 was calculated as suggested by the COUNTER Code of Practice for Usage Factors. It is the median value of the number of downloads in 2017/18 for all articles published online in that particular journal during the same time period. The Usage Factor calculation is based on COUNTER-compliant usage data on the SpringerLink platform. (Counting Online Usage of NeTworked Electronic Resources) standards.

Impact
  • 0.48Source Normalized Impact per Paper (SNIP) 2018
    Source Normalized Impact per Paper (SNIP) measures contextual citation impact by weighting citations based on the total number of citations in a subject field. The impact of a single citation is given higher value in subject areas where citations are less likely, and vice versa.
  • Q3Quartile: Electrical and Electronic Engineering 2017
    The set of journals have been ranked according to their SJR and divided into four equal groups, four quartiles. Q1 (green) comprises the quarter of the journals with the highest values, Q2 (yellow) the second highest values, Q3 (orange) the third highest values and Q4 (red) the lowest values.
  • 0.17 SCImago Journal Rank (SJR) 2018
    SCImago Journal Rank (SJR) is a measure of scientific influence of scholarly journals that accounts for both the number of citations received by a journal and the importance or prestige of the journals where such citations come from.
  • 7H-Index 2018
    A journal has an H index of h if it published h papers each of which has been cited in other journals at least h times. Calculations are based on Scopus.

SCOPE

Optoelectronics, Instrumentation and Data Processing  focuses on the following areas: analysis and synthesis of signals and images;automated measurement systems; computational and information-measuring systems; physicotechnical foundations of micro- and optoelectronics; optical information technologies; modelling in physicotechnical research; nanotechnologies in optics and electronics. This journal reports on several growing areas of physical and computer research. From its inception it has covered the design and development of instrumentation and systems for automatic measurement. Its scope has broadened to include automation based on laser and optoelectronic technologies, laser and non-linear optics, new information technologies and problem-oriented computer systems. The journal presents timely results of basic and applied research on solid state physics, optics and holography in applications to computers and measurement techniques; physical aspects of micro- and optoelectronics; optical information technologies, systems and components; laser physics applications; automated measurement systems; automation of scientific R&D and industrial automation; real-time image analysis and synthesis systems; AI methods and systems in scientific research and management; computer networks and data transmission systems; computer-aided VLSI design, and other topics.

READERSHIP

The journal is addressed to scientists, aspirants, engineers and students who are interested in the results of fundamental and applied researches in such areas as IT on the basis of current achievements of Physics, Photochemistry, Materials Science, Informatics and Computer technologies.

ABSTRACTING & INDEXING

Astrophysics Data System (ADS), EBSCO Discovery Service, EI Compendex, Emerging Sources Citation Index, Gale, Gale Academic OneFile, Google Scholar, INIS Atomindex, INSPEC, Institute of Scientific and Technical Information of China, Japanese Science and Technology Agency (JST), Naver, OCLC WorldCat Discovery Service, ProQuest-ExLibris Primo, ProQuest-ExLibris Summon, SCImago, SCOPUS, WTI Frankfurt eG.

CONTACTS

Avtometriya
Institute of Automation and Electrometry
Pr. Ak. Koptyuga 1, Novosibirsk, 630090 Russia
Phone: +7 (383) 330-90-48, +7 (383) 330-79-38
Fax: + 7 (383) 330-88-78
E-mail: Malinovsky@iae.nsk.su, nechaev@hydro.nsc.ru, shalagin@iae.nsk.su
Web-site: http://www.iae.nsk.su